Learning non-metric partial similarity based on maximal margin criterion

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 1, Issue , 2006, Pages 138-145

  Tan, Xiaoyang ^a,b   Chen, Songcan ^a   Zhou, Zhi Hua ^b   Liu, Jun ^a  

^a NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS   (China)

^b NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

MACHINE LEARNING ALGORITHMS; MAP BASED EMBEDDING TECHNIQUE; MAXIMAL MARGIN CRITERION;

COMPUTATIONAL METHODS; COMPUTER VISION; CONFORMAL MAPPING; EMBEDDED SYSTEMS; FACE RECOGNITION; FEATURE EXTRACTION; PROBLEM SOLVING;

LEARNING SYSTEMS;

EID: 33845598314     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2006.170     Document Type: Conference Paper

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