Classification with nonmetric distances: Image retrieval and class representation

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 22, Issue 6, 2000, Pages 583-600

  Jacobs, David W ^a,b,c   Weinshall, Daphna ^a   Gdalyahu, Yoram ^a  

^a NEC LABORATORIES AMERICA   (United States)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^c IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; IMAGE RECONSTRUCTION; LEARNING SYSTEMS; OPTICAL CORRELATION; PROBLEM SOLVING;

APPEARANCE-BASED VISIONS; EUCLIDEAN SPACES; SUPERVISED LEARNING;

PATTERN MATCHING;

EID: 0034204827     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.862197     Document Type: Article

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