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IEICE Transactions on Electronics

Volumn E89-C, Issue 12, 2006, Pages 1872-1879

Characterization of high Q transmission line structure for advanced CMOS processes

(3) Lai, Ivan Chee Hong a Tanimoto, Hideyuki a Fujishima, Minoru a

a UNIVERSITY OF TOKYO (Japan)

Author keywords

Attenuation; CMOS; Quality factor; Slow waves; Transmission line

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC IMPEDANCE; ELECTROMAGNETIC WAVE ATTENUATION; WAVE PROPAGATION;

Q TRANSMISSION LINE; QUALITY-FACTOR; SLOW-WAVES; TRANSMISSION-REFLECTION MODULE;

ELECTRIC LINES;

EID: 33845597264 PISSN: 09168524 EISSN: 17451353 Source Type: Journal
DOI: 10.1093/ietele/e89-c.12.1872 Document Type: Conference Paper

Times cited : (29)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.