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Volumn 2006, Issue , 2006, Pages 1232-1239

Durability of Pb-free solder connection between copper interconnect wire and crystalline silicon solar cells

Author keywords

Energy partitioning fatigue model; Pb Free solder; Photovoltaic cells; Thermal cycling durability; Viscoplastic finite element analysis

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRIC CONTACTS; ELECTRIC WIRE; FINITE ELEMENT METHOD; SILICON; SOLAR CELLS; THERMAL CYCLING; VISCOPLASTICITY;

EID: 33845595943     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITHERM.2006.1645486     Document Type: Conference Paper
Times cited : (8)

References (11)
  • 1
    • 1942436339 scopus 로고    scopus 로고
    • Assessing the reliability and degradation of photovoltaic module performance parameters
    • E.L., Meyer, E.E., and Van Dyk, "Assessing the Reliability and Degradation of Photovoltaic Module Performance parameters" IEEE Transactions On Reliability, 53, 1, pp. 83-92, 2004
    • (2004) IEEE Transactions on Reliability , vol.53 , Issue.1 , pp. 83-92
    • Meyer, E.L.1    Van Dyk, E.E.2
  • 2
    • 33845595943 scopus 로고    scopus 로고
    • Durability of Pb-free solder connection between copper interconnect wire and crystalline silicon solar cells - Experimental approach
    • Georgia Tech, Atlanta, March
    • G., Cuddalorepatta, A., Dasgupta, S., Sealing, M., Moyer, T., Tolliver, and J., Loman, "Durability of Pb-free Solder Connection between Copper Interconnect Wire and Crystalline Silicon Solar Cells - Experimental Approach", IEEE CPMT APM Conference, Georgia Tech, Atlanta, March 2006
    • (2006) IEEE CPMT APM Conference
    • Cuddalorepatta, G.1    Dasgupta, A.2    Sealing, S.3    Moyer, M.4    Tolliver, T.5    Loman, J.6
  • 4
    • 33845565918 scopus 로고    scopus 로고
    • Examination of solar cells and encapsulations of small experimental photovoltaic modules
    • V., Saly, M., Ruzinsky, J., Packa, and P., Redi, "Examination of Solar Cells and Encapsulations of Small Experimental Photovoltaic Modules", IEEE Polytronic Conference. pp. 137-141, 2002
    • (2002) IEEE Polytronic Conference , pp. 137-141
    • Saly, V.1    Ruzinsky, M.2    Packa, J.3    Redi, P.4
  • 8
    • 85013292283 scopus 로고
    • Solder creep-fatigue analysis by an energy-partitioning approach
    • A., Dasgupta, C., Oyan, D., Barker, and Pecht, M., "Solder Creep-Fatigue Analysis by an Energy-Partitioning Approach," ASME Joumal of Electronic Packaging, Vol. 114, No. 2, pp. 152-160, 1992
    • (1992) ASME Joumal of Electronic Packaging , vol.114 , Issue.2 , pp. 152-160
    • Dasgupta, A.1    Oyan, C.2    Barker, D.3    Pecht, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.