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Volumn 2006, Issue , 2006, Pages 1338-1342

Thin film substrate technology and FC interconnection for very high frequency applications

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL TESTS; HIGH FREQUENCY MEASUREMENT SYSTEMS; SUBSTRATE TECHNOLOGY; THIN FILM SUBSTRATES;

EID: 33845595106     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2006.1645829     Document Type: Conference Paper
Times cited : (5)

References (15)
  • 2
    • 33845587911 scopus 로고    scopus 로고
    • The importance of polymers in WLP
    • Book chapter, (E. Zschech, C. Whelan, T. Mikolajick, Ed.), Springer
    • /2a/ M. Töpper, The Importance of Polymers in WLP, Book chapter, Materials for Information Technology (E. Zschech, C. Whelan, T. Mikolajick, Ed.), Springer, 2005, pp. 347 - 362
    • (2005) Materials for Information Technology , pp. 347-362
    • Töpper, M.1
  • 6
    • 0002083650 scopus 로고    scopus 로고
    • Multilayer thin film MCM-D for the integration of high-performance wireless front-end systems
    • /2e/ G. Carchon, P. Pieters, K. Vaesen, W. DeRaedt, B. Nauwelaers, E. Beyne "Multilayer Thin Film MCM-D for the Integration of High-Performance Wireless Front-End Systems" Microwave Journal, 44, pp. 96-110, 2001
    • (2001) Microwave Journal , vol.44 , pp. 96-110
    • Carchon, G.1    Pieters, P.2    Vaesen, K.3    DeRaedt, W.4    Nauwelaers, B.5    Beyne, E.6
  • 9
    • 10444271693 scopus 로고    scopus 로고
    • New wafer-level-packaging technology using silicon-via-contacts for optical and other sensor applications
    • Las Vegas, June
    • /2h/ J. Leib, M. Töpper, "New Wafer-Level-Packaging Technology using Silicon-Via-Contacts For Optical And Other Sensor Applications", Proceedings 54th Electronic Components and Technology Conf, Las Vegas, June 2004, pp. 843 - 847
    • (2004) Proceedings 54th Electronic Components and Technology Conf , pp. 843-847
    • Leib, J.1    Töpper, M.2
  • 10
    • 17744404194 scopus 로고    scopus 로고
    • Interfacial adhesion analysis of BCB / TiW / Cu / PbSn technology in waferlevel packaging
    • Las Vegas, June
    • /3/ M. Topper, A. Achen, H. Reichl, Interfacial Adhesion Analysis of BCB / TiW / Cu / PbSn Technology in Waferlevel Packaging, Proceedings ECTC 2003, Las Vegas, June 2003.
    • (2003) Proceedings ECTC 2003
    • Topper, M.1    Achen, A.2    Reichl, H.3
  • 13
    • 84860045841 scopus 로고    scopus 로고
    • Flip-chip-technik geeigneter übergang von microstripline zu coplanar waveguide für 160 GBit/s verbindungen
    • 11. Mai Berlin, Germany
    • /6/ Th. Rosin et al.: "Flip-Chip-Technik geeigneter Übergang von Microstripline zu Coplanar Waveguide für 160 GBit/s Verbindungen", Photonische Aufbau- und Verbindungstechnik, PAVT 2005, 11. Mai 2005, Berlin, Germany.
    • (2005) Photonische Aufbau- und Verbindungstechnik, PAVT 2005
    • Rosin, Th.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.