Diffusion distance for histogram comparison

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 1, Issue , 2006, Pages 246-253

  Ling, Haibin ^a   Okada, Kazunori ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b SIEMENS CORPORATE RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MULTI-DIMENSIONAL HISTOGRAM; QUADRATIC COMPLEXITY; SHAPE RECOGNITION;

COMPUTATIONAL COMPLEXITY; DIFFUSION; PATTERN MATCHING; ROBUSTNESS (CONTROL SYSTEMS); VECTOR QUANTIZATION;

IMAGE ANALYSIS;

EID: 33845589304     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2006.99     Document Type: Conference Paper

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