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Volumn , Issue , 2004, Pages 15-22

Calculations of measurement uncertainty in complex-valued quantities involving 'uncertainty in the uncertainty'

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL COMMUNICATION SYSTEMS; MICROWAVE MEASUREMENT;

EID: 33845578671     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGF.2004.1427565     Document Type: Conference Paper
Times cited : (6)

References (12)
  • 4
    • 84960468134 scopus 로고    scopus 로고
    • Evaluating and expressing uncertainty in complex S-pammeter measurements
    • Boulder, CO, Nov
    • N. M. Ridler and M. J. Salter, Evaluating and expressing uncertainty in complex S-pammeter measurements, (56th ARFTG Conf. Digest, Boulder, CO, Nov. 2000).
    • (2000) 56th ARFTG Conf. Digest
    • Ridler, N.M.1    Salter, M.J.2
  • 5
    • 84949668547 scopus 로고    scopus 로고
    • Propagating S-parameter uncertainties to other measurement quantities
    • San Diego, CA, Nov
    • N. M. Ridler and M. J. Salter, Propagating S-parameter uncertainties to other measurement quantities, (58th ARFTG Conf. Digest, San Diego, CA, Nov. 2001).
    • (2001) 58th ARFTG Conf. Digest
    • Ridler, N.M.1    Salter, M.J.2
  • 10
    • 0242304821 scopus 로고    scopus 로고
    • On the use of Bayesian statistics to make the 'Guide to the Expression of Uncertainty in Measurement' consistent
    • R. Kacker and A. Jones, On the use of Bayesian statistics to make the 'Guide to the Expression of Uncertainty in Measurement' consistent, Metrologia 40 (2003) 235-248.
    • (2003) Metrologia , vol.40 , pp. 235-248
    • Kacker, R.1    Jones, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.