Structure and view estimation for tomographic reconstruction: A Bayesian approach

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 2, Issue , 2006, Pages 2253-2260

  Mallick, Satya P ^a   Agarwal, Sameer ^a   Kriegman, David J ^a   Belongie, Serge J ^a   Carragher, Bridget ^b   Potter, Clinton S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SCRIPPS RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROGRAPH ANALYSIS (EMAN); SCENE DENSITY; STRUCTURE-FROM-MOTION (SFM);

CAMERAS; COMPUTERIZED TOMOGRAPHY; ELECTRON MICROSCOPY; IMAGE ANALYSIS; PROJECTION SYSTEMS; X RAY MICROSCOPES;

IMAGE RECONSTRUCTION;

EID: 33845562500     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2006.295     Document Type: Conference Paper

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