A new design of Doherty amplifiers using defected ground structure

IEEE Microwave and Wireless Components Letters

Volumn 16, Issue 12, 2006, Pages 687-689

  Choi, Heung Jae ^a,b   Lim, Jong Sik ^a,c   Jeong, Yong Chae ^a,b  

^a Chonbuk National University ^*

^b Chonbuk National University   (South Korea)

^c Soonchunhyang University   (South Korea)

Author keywords

Defected ground structure (DGS); DGS doherty amplifier (DDA); Doherty amplifier; Linearity; Power added efficiency (PAE)

Indexed keywords

DIFFERENTIATING CIRCUITS; ELECTRIC LINES; GAIN CONTROL; HARMONIC GENERATION; LEAKAGE CURRENTS; MICROSTRIP LINES;

DEFECTED GROUND STRUCTURE (DGS); DGS DOHERTY AMPLIFIER (DDA); DOHERTY AMPLIFIER; POWER ADDED EFFICIENCY (PAE);

AMPLIFIERS (ELECTRONIC);

EID: 33845522882     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2006.885636     Document Type: Article

References (6)

1. S. C. Cripps, RF Power Amplifier for Wireless Communications. Boston, MA: Artech House, 1999, pp. 251-282.
2. M. Iwamoto, A. Williams, P.-F. Chen, A. G. Metzger, L. E. Larson, and P. M. Asbeck, "An extended Doherty amplifier with high efficiency over a wide power range," IEEE Trans. Microw. Theory Tech., vol. 49, no. 12, pp. 2472-2479, Dec. 2001.
3. J.-S. Lim, Y.-C. Jeong, D. Ahn, and S. Nam, "Improvement in performance of power amplifiers by defected ground structure," IEICE Trans. Electron., vol. E87-C, no. 1, pp. 52-59, Jan. 2004.
4. Y.-C. Jeong, S.-G. Jeong, J.-S. Lim, and S. Nam, "A new method to suppress harmonics using A/4 bias line combined by defected ground structure in power amplifiers," IEEE Microw. Wireless Compon. Lett., vol. 13, no. 12, pp. 538-540, Dec. 2003.
5. Y. Yang, J. Yi, Y. Y. Woo, and B. Kim, "Optimum design for linearity and efficiency of a microwave Doherty amplifier using a new load matching technique," Microw. J., vol. 44, pp. 20-36, Dec. 2001.
6. J.-S. Lim, C.-S. Kim, D. Ahn, Y.-C. Jeong, and S. Nam, "Design of low-pass filters using defected ground structure," IEEE Trans. Microw. Theory Tech., vol. 53, no. 8, pp. 2539-2545, Aug. 2005.