Ion beam induced crystal-edge nanoclusters at the origin of poly(ethylene glycol) film stabilization

Applied Surface Science

Volumn 253, Issue 2, 2006, Pages 810-813

  Manso, M ^a   Valsesia, A ^b   Ceccone, G ^b   Rossi, F ^b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b JOINT RESEARCH CENTRE   (Italy)

Author keywords

Ion beam modification; Nanocluster; PEG; Polymers; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ION BEAMS; POLYETHYLENE GLYCOLS; POLYMERS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTAL EDGES; ELASTIC PROPERTIES; ION BEAM MODIFICATION; NANOCLUSTERS;

NANOSTRUCTURED MATERIALS;

EID: 33845463747     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.01.033     Document Type: Article

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