Properties and determination of the interface stiffness

Acta Materialia

Volumn 55, Issue 2, 2007, Pages 467-471

  Du, Danxu ^a   Zhang, Hao ^a   Srolovitz, David J ^a,b  

^a Princeton University   (United States)

^b YESHIVA UNIVERSITY   (United States)

Author keywords

Grain boundary migration; Interface migration; Interface stiffness; Surface energy

Indexed keywords

COMPUTER SIMULATION; CRYSTAL SYMMETRY; CRYSTALLINE MATERIALS; GRAIN BOUNDARIES; INTERFACES (MATERIALS); INTERFACIAL ENERGY;

GRAIN BOUNDARY MIGRATION; INTERFACE MIGRATION; INTERFACE STIFFNESS; STIFFNESS TENSOR;

STIFFNESS;

EID: 33845431695     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2006.08.038     Document Type: Article

References (6)

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