Analysis of the chemical bath and its effect on the physical properties of CdS/ITO thin films

Brazilian Journal of Physics

Volumn 36, Issue 3 B, 2006, Pages 1054-1057

  Herrera, S ^a   Ramos, C M ^a   Patino R ^a   Pena J L ^a   Cauich, W ^a   Oliva, A I ^a  

^a DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

Author keywords

Cadmium sulphide; Chemical bath analysis; Predominance diagrams; Semiconductor film

Indexed keywords

EID: 33845428827     PISSN: 01039733     EISSN: 01039733     Source Type: Journal    
DOI: 10.1590/S0103-97332006000600068     Document Type: Conference Paper

References (6)

1. Y. J. Chang, C. L. Munsee, G. S. Herman, J. F. Wager, P. Mugdur, D. H. Lee, and C. H. Chang, Surf. Interface Anal. 37, 398 (2005).
2. A. Arias-Carbajal Reádigos, V. M. García, O. Gomezdaza, J. Campos, M. T. S. Nair, and P. K. Nair, Semicond. Sci. Technol. 15, 1022 (2000).
3. R. Ortega-Borges, D. Lincot, J. Electrochem. Soc. 140, 3464 (1993).
4. J. M. Doña, J. Herrero, J. Electrochem. Soc. 144, 4081 (1997).
5. M. E. Páez-Hernández, M. T. Ramírez, A. Rojas-Hernández, Talanta 51, 107 (2000).
6. A. Maldonado, R. Asomoza, J. Canetas-Ortega, E. P. Zironi, R. Hernández, R. Patiño, and O. Solorza-Feria, Solar Energy Materials & Solar Cells 57, 331 (1999).