Using neural networks as a fault detection mechanism in MEMS devices

Microelectronics Reliability

Volumn 47, Issue 1, 2007, Pages 142-149

  Asgary, Reza ^a   Mohammadi, Karim ^a   Zwolinski, Mark ^b  

^a IRAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Iran)

^b UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER SIMULATION; ELECTRIC FAULT LOCATION; INTEGRATED CIRCUITS; NEURAL NETWORKS;

ANALOG INTEGRATED CIRCUITS; COMPETITIVE NEURAL NETWORK (CNN); FAULT CLASSIFICATION; HETEROSCEDASTIC PROBABILISTIC NEURAL NETWORK (RHPNN);

MICROELECTROMECHANICAL DEVICES;

EID: 33845391340     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2006.04.012     Document Type: Article

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