Robust particle systems for curvature dependent sampling of implicit surfaces

Proceedings - International Conference on Shape Modeling and Applications, SMI'05

Volumn 2005, Issue , 2005, Pages 124-133

  Meyer, Miriah D ^a   Georgel, Pierre ^b   Whitaker, Ross T ^a  

^a Department of Electrical and Computer Engineering   (United States)

^b Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE FRAMEWORK; CONTROLLABLE MECHANISMS; CURVATURE DEPENDENT SAMPLING;

CURVE FITTING; NUMERICAL METHODS; PARAMETER ESTIMATION; ROBUSTNESS (CONTROL SYSTEMS); SET THEORY; TOPOLOGY;

SURFACE PHENOMENA;

EID: 33845387546     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMI.2005.41     Document Type: Conference Paper

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