Using particles to sample and control more complex implicit surfaces

Proceedings - SMI 2002: Shape Modeling International 2002

Volumn , Issue , 2002, Pages 129-136

  Hart, John C ^a   Bachta, Ed ^a   Jarosz, Wojciech ^a   Fleury, Terry ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX MODEL; ERROR PRONES; IMPLEMENT AND OPERATE; IMPLICIT MODEL; IMPLICIT SURFACES; MANAGEMENT AND CONTROLS; NUMERICAL DIFFERENTIATION; PARTICLE SYSTEMS;

DIFFERENTIATION (CALCULUS);

EID: 33847290433     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMI.2002.1003537     Document Type: Conference Paper

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