Characterization of LiTaO3 thin films fabricated by sol-gel technique

Microelectronics Journal

Volumn 38, Issue 1, 2007, Pages 63-66

  Youssef, S ^a,c   Al Asmar, R ^a,b   Podlecki, J ^a   Pascal Delannoy, F ^a   Zaatar, Y ^b   Foucaran, A ^a  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b HOLY SPIRIT UNIVERSITY OF KASLIK USEK   (Lebanon)

^c LEBANESE UNIVERSITY   (Lebanon)

Author keywords

Lithium tantalite; Optical measurements; Pyroelectric property; Sol gel; Structural properties; Thermal analysis

Indexed keywords

HEAT TREATMENT; LITHIUM COMPOUNDS; OPTICAL VARIABLES MEASUREMENT; RAMAN SPECTROSCOPY; SOL-GELS; THERMOANALYSIS; X RAY DIFFRACTION;

GROWTH PARAMETERS; LITHIUM TANTALITE; PYROELECTRIC PROPERTIES; STRUCTURAL PROPERTIES;

THIN FILMS;

EID: 33845318560     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2006.09.010     Document Type: Article

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