A new approach to determine and quantify structural units in silicate glasses using micro-reflectance Fourier-Transform infrared spectroscopy

American Mineralogist

Volumn 91, Issue 11-12, 2006, Pages 1783-1793

  Dalby, Kim N ^a   King, Penelope L ^a  

^a UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Band fitting; Glass structure; IR spectroscopy; PbO SiO2

Indexed keywords

FOURIER SERIES; GLASS; INFRARED SPECTROSCOPY; KRAMERS-KRONIG RELATIONS; LEAD OXIDE; SILICA; SILICATES; SILICON;

BAND FITTING; FOURIER TRANSFORM INFRA REDS; GLASS STRUCTURE; NUCLEAR MAGNETIC RESONANCE DATA; PBO-SIO2; SECOND DERIVATIVES; STRUCTURAL UNIT; VIBRATIONAL MODES;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

CRYSTAL STRUCTURE; FTIR SPECTROSCOPY; GLASS; SILICATE;

EID: 33845264177     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2006.2075     Document Type: Article

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