Dispersion analysis of FTIR reflection measurements in silicate glasses

Journal of Non-Crystalline Solids

Volumn 275, Issue 1, 2000, Pages 72-82

  MacDonald, Steven A ^a   Schardt, Craig R ^a   Masiello, David J ^a   Simmons, Joseph H ^a,b  

^a UNIVERSITY OF FLORIDA   (United States)

^b University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELECTROMAGNETIC DISPERSION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FUNCTIONS; LEACHING; LIGHT REFLECTION; NONDESTRUCTIVE EXAMINATION; SILICATES; WATER;

DIELECTRIC FUNCTIONS; KRAMERS-KRONIG RELATIONS; SILICATE GLASS;

GLASS;

EID: 0034274262     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(00)00121-6     Document Type: Article

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