A two-stage-classifier for defect classification in optical media inspection

Proceedings - International Conference on Pattern Recognition

Volumn 16, Issue 4, 2002, Pages 373-376

  Toth, Daniel ^a   Condurache, Alexandru ^a   Aach, Til ^a  

^a UNIVERSITY OF LÜBECK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COST EFFECTIVENESS; FUZZY SETS; INDUSTRIAL APPLICATIONS; INSPECTION; OPTIMIZATION; COMPACT DISKS; DEFECTS; ECONOMIC AND SOCIAL EFFECTS; FACE RECOGNITION; MOTION COMPENSATION; NEAREST NEIGHBOR SEARCH; OPTICAL MATERIALS; PATTERN RECOGNITION; PATTERN RECOGNITION SYSTEMS;

DEFECT CLASSIFICATION; OPTICAL MEDIA INSPECTION; TWO-STAGE ALGORITHM;

PATTERN RECOGNITION; CLASSIFICATION (OF INFORMATION);

CLASSIFICATION ALGORITHM; CLASSIFICATION RATES; DEFECT CLASSIFICATION; DIGITAL VERSATILE DISKS; FUZZY K-NEAREST NEIGHBOR CLASSIFIER; INDUSTRIAL INSPECTIONS; MINIMUM DISTANCE CLASSIFIERS; TWO-STAGE CLASSIFIERS;

EID: 33845233642     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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