X-ray phase contrast imaging using a grating interferometer

Europhysics News

Volumn 37, Issue 5, 2006, Pages 13-15

  Pfeiffer, Franz ^a   Weitkamp, Timm ^b   David, Christian ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33845232234     PISSN: 05317479     EISSN: 14321092     Source Type: Journal    
DOI: 10.1051/epn:2006501     Document Type: Review

References (11)

1. R. Fitzgerald, Physics Today 53, 23 (2000).
2. A. Momose, Optics Express 11, 2303 (2003).
3. A. Momose, Jap. Jour. Appl. Phys. 44, 6355 (2005).
4. F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, Nature Physics 2, 258 (2006).
5. T. Weitkamp, A. Diaz, C. David, F. Pfeiffer, M. Stampanoni, P. Cloetens, and E. Ziegler, Optics Express 13, 6296 (2005).
6. T. Weitkamp, A. Diaz, B. Nöhammer, E Pfeiffer, T. Rohbeck, P. Cloetens, and C. David, Proc. SPIE 5535, 137 (2004).
7. C. David, F. Pfeiffer, and T. Weitkamp, European patent application 05012121.9 / EP05012121 (2005).
8. E. Pagot, S. Fiedler, P. Cloetens, A. Bravin, P. Coan, K. Fezzaa, J. Baruchel, and J. Härtwig, Phys. Med. Biol. 50, 709 (2005).
9. T. Weitkamp, B. Nöhammer, A. Diaz, C. David, and E. Ziegler, Appl. Phys. Lett. 86, 054101 (2005).
10. F. Pfeiffer, C. Grünzweig, O. Bunk, G. Frei, E. Lehmann, and C. David, Phys. Rev. Lett. 96, 215505 (2006).
11. D.W. Keith, C.R. Ekstrom, Q.A. Turchette, and D.E. Pritchard, Phys. Rev. Lett. 66, 2693 (1991).