Position sensitive x-ray spectrophotometer using microwave kinetic inductance detectors

Applied Physics Letters

Volumn 89, Issue 22, 2006, Pages

  Mazin, Benjamin A ^a   Bumble, Bruce ^a   Day, Peter K ^a   Eckart, Megan E ^b   Golwala, Sunil ^b   Zmuidzinas, Jonas ^b   Harrison, Fiona A ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION CONSTANT; ENERGY RESOLUTION; MICROWAVE KINETIC INDUCTANCE DETECTOR (MKID); PHOTON DETECTION; PHOTON ENERGY;

MICROWAVES; PHOTONS; RADIATION DETECTORS; SUPERCONDUCTING MATERIALS; THIN FILM CIRCUITS;

X RAY SPECTROPHOTOMETERS;

EID: 33751567438     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2390664     Document Type: Article

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