메뉴 건너뛰기




Volumn 26, Issue 10, 2006, Pages 1589-1593

Preparation and IR properties of GeC/GaP antireflective and protective thin films on ZnS substrates

Author keywords

GaP; GeC; Infrared antireflective and protective thin film; RF magnetron sputtering; Thin film optics

Indexed keywords

ABSORPTION; ANTIREFLECTION COATINGS; MAGNETRON SPUTTERING; PROTECTIVE COATINGS; REFRACTIVE INDEX; SINGLE CRYSTALS;

EID: 33751558938     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (8)

References (12)
  • 1
    • 33646416283 scopus 로고    scopus 로고
    • Infrared transmissing material ZnS
    • in Chinese
    • Yu Huaizhi, Zheng Yuehua, Liu Jianping et al.. Infrared transmissing material ZnS[J], Laser and Infrared, 1997, 27(6): 366-370 (in Chinese).
    • (1997) Laser and Infrared , vol.27 , Issue.6 , pp. 366-370
    • Yu, H.1    Zheng, Y.2    Liu, J.3
  • 2
    • 0041859820 scopus 로고
    • Review of recent advances in infrared antireflection coatings
    • A. H. Lettington. Review of recent advances in infrared antireflection coatings[C]. Proc. SPIE, 1988, 915: 60-66.
    • (1988) Proc. SPIE , vol.915 , pp. 60-66
    • Lettington, A.H.1
  • 3
    • 0026961615 scopus 로고
    • Ultradurable phosphide-based antireflection coatings for sand and rain erosion protection
    • D. R. Gibson, E. M. Waddell, J. W. Kerr et al.. Ultradurable phosphide-based antireflection coatings for sand and rain erosion protection[C]. Proc. SPIE, 1992, 1760: 178-200.
    • (1992) Proc. SPIE , vol.1760 , pp. 178-200
    • Gibson, D.R.1    Waddell, E.M.2    Kerr, J.W.3
  • 4
    • 0028756135 scopus 로고
    • Advances in ultradurable phosphide-based broadband anti-reflection coatings for sand and rain erosion protection of infrared windows and domes
    • D. R. Gibson, E. M. Waddell, K. L. Lewis, Advances in ultradurable phosphide-based broadband anti-reflection coatings for sand and rain erosion protection of infrared windows and domes[C]. Proc. SPIE, 1994, 2286: 335-346.
    • (1994) Proc. SPIE , vol.2286 , pp. 335-346
    • Gibson, D.R.1    Waddell, E.M.2    Lewis, K.L.3
  • 5
    • 17044400615 scopus 로고    scopus 로고
    • Infrared transmission performance of gallium phosphide thin films deposited by RF magnetron sputtering
    • Li Yanping, Liu Zhengtang. Infrared transmission performance of gallium phosphide thin films deposited by RF magnetron sputtering[C]. Materials Science Forum, 2005, 475-479: 3685-3688.
    • (2005) Materials Science Forum , vol.475-479 , pp. 3685-3688
    • Li, Y.1    Liu, Z.2
  • 6
    • 25644458523 scopus 로고    scopus 로고
    • Gallium phosphide protective infrared films on zinc sulphide deposited by RF-planar magnetron sputtering
    • Li Yanping, Liu Zhengtang, Cui Hu. Gallium phosphide protective infrared films on zinc sulphide deposited by RF-planar magnetron sputtering[C]. Proc. SPIE, 2004, 5774: 192-195.
    • (2004) Proc. SPIE , vol.5774 , pp. 192-195
    • Li, Y.1    Liu, Z.2    Cui, H.3
  • 7
    • 0017017243 scopus 로고
    • A simple method for the determination of the optical constant n, k, and the thickness of a weakly absorbing thin film
    • J C Manifacier, J Gasiot, J P Fillard. A simple method for the determination of the optical constant n, k, and the thickness of a weakly absorbing thin film[J]. J. Phys. E: Sci. Instrum., 1976, 9: 1002-1004.
    • (1976) J. Phys. E: Sci. Instrum. , vol.9 , pp. 1002-1004
    • Manifacier, J.C.1    Gasiot, J.2    Fillard, J.P.3
  • 8
    • 0020940620 scopus 로고
    • Determination of the thickness and optical constants of amorphous silicon
    • R. Swanepoel. Determination of the thickness and optical constants of amorphous silicon[J]. J. Phys. E: Sci. Instrum., 1983, 16: 1214-1222.
    • (1983) J. Phys. E: Sci. Instrum. , vol.16 , pp. 1214-1222
    • Swanepoel, R.1
  • 9
    • 0000490079 scopus 로고    scopus 로고
    • Optical characterization of dielectric and semiconductor thin films by use of transmission data
    • Jorge I. Cisneros. Optical characterization of dielectric and semiconductor thin films by use of transmission data[J]. Appl. Opt., 1998, 37(22): 5262-5270.
    • (1998) Appl. Opt. , vol.37 , Issue.22 , pp. 5262-5270
    • Cisneros, J.I.1
  • 10
    • 5544301953 scopus 로고
    • Toward a unified theory of Urbach s rules and exponential absorption edges
    • John D. Dow, David Redfietd. Toward a unified theory of Urbach s rules and exponential absorption edges[J]. Phys. Rev. B, 1972, 5(20): 594-610.
    • (1972) Phys. Rev. B , vol.5 , Issue.20 , pp. 594-610
    • Dow, J.D.1    Redfietd, D.2
  • 11
    • 0035971451 scopus 로고    scopus 로고
    • A generalized Cauchy dispersion formula and the refractivity of elemental semiconductors
    • D. Y. Smith, Mitio Inokuti, William Karstens. A generalized Cauchy dispersion formula and the refractivity of elemental semiconductors[J]. J. Phys.: Condens. Matter, 2001, 13: 3883-3893.
    • (2001) J. Phys.: Condens. Matter , vol.13 , pp. 3883-3893
    • Smith, D.Y.1    Inokuti, M.2    Karstens, W.3
  • 12
    • 33751583011 scopus 로고    scopus 로고
    • Design and application of antireflective and protective films software
    • in Chinese
    • Song Jianquan, Liu Zhengtang, Geng Dongsheng et al.. Design and application of antireflective and protective films software[J]. Infrared Technology, 2001, 23(2): 1-3 (in Chinese).
    • (2001) Infrared Technology , vol.23 , Issue.2 , pp. 1-3
    • Song, J.1    Liu, Z.2    Geng, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.