The role of MFM signal in mark size measurement in probe-based magnetic recording on CoNi/Pt multilayers

Physica B: Condensed Matter

Volumn 387, Issue 1-2, 2007, Pages 328-332

  Zhang, Li ^a   Bain, James A ^b   Zhu, Jian Gang ^b   Abelmann, Leon ^c   Onoue, Takahiro ^c  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b CARNEGIE MELLON UNIVERSITY   (United States)

^c UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

High density magnetic recording; Lift height in MFM scanning; Magnetic force microscopy (MFM)

Indexed keywords

COBALT COMPOUNDS; MAGNETIC FIELDS; MULTILAYERS; OPTICAL RESOLVING POWER; SCANNING TUNNELING MICROSCOPY;

FULL-WIDTH HALF-MAXIMUM (FWHM); HIGH-DENSITY MAGNETIC RECORDING; MAGNETIC FORCE MICROSCOPY (MFM);

MAGNETIC RECORDING;

EID: 33751426365     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.04.028     Document Type: Article

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