Computer screen photoassisted off-null ellipsometry

Applied Optics

Volumn 45, Issue 30, 2006, Pages 7795-7799

  Bakker, J W P ^a   Arwin, H ^a   Lundstrom I ^a   Filippini, D ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENT SCREENS; IMAGING SYSTEMS; LIGHT SOURCES; MATHEMATICAL MODELS; OPTICAL RESOLVING POWER; SENSITIVITY ANALYSIS;

COMPUTER SCREENS; PHOTOASSISTED TECHNIQUES; THICKNESS RESOLUTION;

ELLIPSOMETRY;

EID: 33751379274     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.007795     Document Type: Article

References (13)

1. D. Filippini, S. P. S. Svensson, and I. Lundström, "Computer screen as a programmable light source for visible absorption characterization of (bio)chemical assays," Chem. Commun. 2, 240-241 (2003).
2. D. Filippini, T. P. M. Andersson, S. P. S. Svensson, and I. Lundström, "Microplate based biosensing with a computer screen aided technique," Biosens. Bioelectron. 19, 35-41 (2003).
3. D. Filippini, J. Bakker, and I. Lundström, "Fingerprinting of fluorescent substances for diagnostic purposes using computer screen illumination," Sens. Actuators B 106, 302-310 (2005).
4. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, 1987).
5. H. Arwin, S. Welin-Klintström, and R. Jansson, "Off-null ellipsometry revisited: basic considerations for measuring surface concentrations at solid/liquid interfaces," J. Colloid Interface Sci. 156, 377-382 (1993).
6. E. D. Palik, ed., Handbook of Optical Constants of Solids (Academic Press, 1985).
7. H. Arwin, "Ellipsometry-based sensor systems," in Encyclopedia of Sensors, C. A. Grimes, E. Dickey, and M. V. Pishko, eds. (American Scientific Publishers, 2006), Vol. 3, pp. 329-358.
8. R. M. Ostroff, D. Maul, G. R. Bogart, S. Yang, J. Christian, D. Hopkins, D. Clark, B. Trotter, and G. Moddel, "Fixed polarizer ellipsometry for simple and sensitive detection of thin films generated by specific molecular interactions: applications in immunoassays and DNA sequence detection," Clin. Chem. 44, 2031-2035 (1998).
9. B. Trotter, G. Moddel, R. Ostroff, and G. R. Bogart, "Fixed- polarizer ellipsometry: a simple technique to measure the thickness of very thin films," Opt. Eng. 38, 902-907 (1999).
10. Z.-Y. Zhao, G. Jin, and Z.-H. Wang, "Detection of somatropin and corticosterone with imaging ellipsometry," in Proceedings of the 20th Annual International Conference of the IEEE Engineering in Medicine and Biology (IEEE, 1998), Vol. 2, pp. 590-593.
11. D. van Noort, S. Welin-Klintström, H. Arwin, S. Zangooie, I. Lundström, and C.-F. Mandenius, "Monitoring specific interaction of low molecular weight biomolecules on oxidized porous silicon using ellipsometry," Biosens. Bioelectron. 13, 439-449 (1998).
12. Y. M. Bae, B.-K. Oh, W. Lee, W. H. Lee, and J.-W. Cho, "Detection of insulin-antibody binding on a solid surface using imaging ellipsometry," Biosens. Bioelectron. 20, 895-902 (2004).
13. Z.-H. Wang and G. Jin, "Silicon surface modification with a mixed silanes layer to immobilize proteins for biosensor with imaging ellipsometry," Colloids Surf. B 34, 173-177 (2004).