SCOPUS 정보 검색 플랫폼

Volumn 385-386 I, Issue , 2006, Pages 574-577

Structural study on optical recording materials Ge2Sb2+xTe5 and GeBi2Te4

Author keywords

DVD; Fast phase transition mechanism; Neutron powder diffraction; Optical recording material; PDF analysis

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ENTROPY; NEUTRON DIFFRACTION; OPTICAL RECORDING; PHASE TRANSITIONS; PROBABILITY DENSITY FUNCTION;

FAST PHASE TRANSITION MECHANISM; LOCAL LATTICE DISTORTIONS; OPTICAL RECORDING MATERIAL; RIETVELD ANALYSES;

GERMANIUM COMPOUNDS;

EID: 33751350299 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/j.physb.2006.05.363 Document Type: Article

Times cited : (5)

References (12)

1
- 5444245742
- Matsunaga T., and Yamada N. Jpn. J. Appl. Phys. 43 7B (2004) 4704
- (2004) Jpn. J. Appl. Phys. , vol.43 , Issue.7 B , pp. 4704
- Matsunaga, T.¹ Yamada, N.²

2
- 5444235653
- Kolobov A., Fons P., Frenkel A.I., Ankudinov A.L., Tominaga J., and Uruga T. Nat. Mater. 3 (2004) 703
- (2004) Nat. Mater. , vol.3 , pp. 703
- Kolobov, A.¹ Fons, P.² Frenkel, A.I.³ Ankudinov, A.L.⁴ Tominaga, J.⁵ Uruga, T.⁶

3
- 4243373450
- Chadi D.J., and Chang K.J. Phys. Rev. Lett. 61 7 (1988) 873
- (1988) Phys. Rev. Lett. , vol.61 , Issue.7 , pp. 873
- Chadi, D.J.¹ Chang, K.J.²

4
- 0005158609
- Yamada N., Ohno E., Nishiuchi K., and Akahira N. J. Appl. Phys. 69 5 (1991) 2849
- (1991) J. Appl. Phys. , vol.69 , Issue.5 , pp. 2849
- Yamada, N.¹ Ohno, E.² Nishiuchi, K.³ Akahira, N.⁴

5
- 0141647449
- Pergamon, Amsterdam
- Egami T., and Billinge S.J.L. Underneath the Bragg Peaks: Structural Analysis of Complex Materials (2003), Pergamon, Amsterdam
- (2003) Underneath the Bragg Peaks: Structural Analysis of Complex Materials
- Egami, T.¹ Billinge, S.J.L.²

6
- 0000191747
- Peterson P., Gutmann P., Proffen Th., and Billinge S.J.L. J. Appl. Crystallogr. 33 (2000) 1192
- (2000) J. Appl. Crystallogr. , vol.33 , pp. 1192
- Peterson, P.¹ Gutmann, P.² Proffen, Th.³ Billinge, S.J.L.⁴

7
- 0000998690
- Proffen Th., and Billinge S.J.L. J. Appl. Crystallogr. 32 (1999) 572
- (1999) J. Appl. Crystallogr. , vol.32 , pp. 572
- Proffen, Th.¹ Billinge, S.J.L.²

8
- 0003891980
- Los Alamos National Laboratory
- Larson A.C., and von Dreele R.B. GSAS: General structure analysis system (1994), Los Alamos National Laboratory
- (1994) GSAS: General structure analysis system
- Larson, A.C.¹ von Dreele, R.B.²

9
- 0035073837
- Toby B.H. J. Appl. Crystallogr. 34 (2001) 210
- (2001) J. Appl. Crystallogr. , vol.34 , pp. 210
- Toby, B.H.¹

10
- 20344362647
- Shamoto S., Taguchi T., Matsunaga T., Yamada N., Ishii K., and Inami T. Mater. Res. Soc. Symp. Proc. 840 (2005) Q6.1
- (2005) Mater. Res. Soc. Symp. Proc. , vol.840
- Shamoto, S.¹ Taguchi, T.² Matsunaga, T.³ Yamada, N.⁴ Ishii, K.⁵ Inami, T.⁶

11
- 33751342410
- Sato M., Matsunaga T., Kouzaki T., and Yamada N. Mater. Res. Soc. Symp. Proc. 803 (2004) HH5.8.1
- (2004) Mater. Res. Soc. Symp. Proc. , vol.803
- Sato, M.¹ Matsunaga, T.² Kouzaki, T.³ Yamada, N.⁴

12
- 17044377602
- Shamoto S., Yamada N., Matsunaga T., Proffen T., Richardson Jr. J.W., Chung J.-H., and Egami T. Appl. Phys. Lett. 86 (2005) 081904
- (2005) Appl. Phys. Lett. , vol.86 , pp. 081904
- Shamoto, S.¹ Yamada, N.² Matsunaga, T.³ Proffen, T.⁴ Richardson Jr., J.W.⁵ Chung, J.-H.⁶ Egami, T.⁷

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.