Structures of optical recording materials Ge2Sb 2+xTe5 studied by pulsed neutron diffraction

Materials Research Society Symposium Proceedings

Volumn 840, Issue , 2005, Pages 125-130

  Shamoto, Shin Ichi ^a   Taguchi, Tomitsugu ^a   Matsunaga, Toshiyuki ^b   Yamada, Noboru ^c   Ishii, Kenji ^d   Inami, Toshiya ^d  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b Matsushita Technoresearch Inc   (Japan)

^c PANASONIC CORPORATION   (Japan)

^d JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ELECTRIC CONDUCTIVITY; LASER BEAM EFFECTS; LIGHT REFLECTION; NEUTRON DIFFRACTION; OPTICAL RECORDING; SEMICONDUCTING ANTIMONY COMPOUNDS; SEMICONDUCTING GERMANIUM COMPOUNDS; STOICHIOMETRY; X RAY POWDER DIFFRACTION;

ATOMIC DISPLACEMENT; CRYSTALLINE CUBIC PHASES; DIFFRACTION PEAKS; OPTICAL REFLECTIVITY;

THIN FILMS;

EID: 20344362647     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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