Quantitative texture measurements using neutron time-of-flight diffraction

Materials Science Forum

Volumn 495-497, Issue PART 1, 2005, Pages 107-112

  Vogel, S C ^a   Hartig, C ^b   Von Dreele, R B ^a,c   Wenk, H R ^d   Williams, D J ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b HAMBURG UNIVERSITY OF TECHNOLOGY   (Germany)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Neutron diffraction; Rietveld; Texture analysis; Time of flight diffraction

Indexed keywords

DATA ACQUISITION; NEUTRON DIFFRACTION; PHASE TRANSITIONS; ROTATION; SPALLING;

HIGH PRESSURE PREFERRED ORIENTATION; NEUTRON TIME-OF-FLIGHT DIFFRACTOMETER; SPALLATION NEUTRON; TEXTURE ANALYSIS;

TEXTURES;

EID: 33751349016     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-975-x.107     Document Type: Conference Paper

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