Characterization of heterogeneous SiO2 materials by scanning electron microscope and micro fluorescence XAS techniques

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 252, Issue 2, 2006, Pages 333-338

  Khouchaf, L ^a   Boinski, F ^a   Tuilier, M H ^b   Flank, A M ^c  

^a ECOLE DES MINES DE DOUAI   (France)

^b UNIVERSITÉ DE HAUTE ALSACE   (France)

^c Swiss Light Source SLS   (Switzerland)

Author keywords

Cations mobility; ESEM; Heterogeneous material; Micro fluorescence; Micro XANES; SiO2 reactivity

Indexed keywords

DIFFUSION; DISSOLUTION; FLUORESCENCE; MOLECULAR STRUCTURE; SCANNING ELECTRON MICROSCOPY; SYNCHROTRON RADIATION;

ALKALI SILICA REACTION (ASR ); CATIONS MOBILITY; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE (ESEM); HETEROGENEOUS MATERIALS; MICRO FLUORESCENCE; SIO2 REACTIVITY;

SILICON COMPOUNDS;

EID: 33751340058     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.07.030     Document Type: Article

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