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Volumn 595, Issue , 2000, Pages
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Simulations of defect-interface interactions in GaN
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33751323672
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (1)
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References (12)
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