Charge-carrier transport mechanism in copper indium di-selenide thin films

Journal of Physics D: Applied Physics

Volumn 32, Issue 12, 1999, Pages 1302-1305

  Firoz Hasan, S M ^a   Subhan, M A ^a   Mannan, Kh M ^b  

^a ATOMIC ENERGY CENTER   (Bangladesh)

^b UNIVERSITY OF DHAKA   (Bangladesh)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CHARGE TRANSFER; COPPER COMPOUNDS; ELECTRIC CONDUCTIVITY MEASUREMENT; EMISSION SPECTROSCOPY; GLASS; HALL EFFECT; PROTONS; REACTION KINETICS; THIN FILMS; VACUUM DEPOSITED COATINGS; X RAY SPECTROSCOPY;

HALL COEFFICIENT; MULTIPLE SCATTERING EFFECT; PROTON-INDUCED X RAY EMISSION (PIXE) SPECTROSCOPY; STACKED ELEMENTAL LAYERS (SEL);

OPTICAL FILMS;

EID: 0032637541     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/12/304     Document Type: Article

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