ENGIN-X: A third-generation neutron strain scanner

Journal of Applied Crystallography

Volumn 39, Issue 6, 2006, Pages 812-825

  Santisteban, J R ^a,c   Daymond, M R ^a,d   James, J A ^b   Edwards, L ^b  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^b OPEN UNIVERSITY   (United Kingdom)

^c CENTRO ATÓMICO BARILOCHE   (Argentina)

^d QUEEN S UNIVERSITY   (Canada)

Author keywords

Engineering strain measurement; Neutron diffractometer; Stress analysis; Time of flight

Indexed keywords

EID: 33751229018     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806042245     Document Type: Article

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