An optimum design for a time-of-flight neutron diffractometer for measuring engineering stresses

Journal of Applied Crystallography

Volumn 35, Issue 1, 2002, Pages 49-57

  Johnson, Michael W ^a   Daymond, Mark R ^a  

^a RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; CALCULATION; CRYSTAL STRUCTURE; INSTRUMENTATION; MOLECULAR DYNAMICS; NEUTRON SCATTERING;

EID: 0036099129     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S002188980101891X     Document Type: Article

References (15)