A contamination-free ultrahigh precision formation flying method for micro-, Nano-, and pico-satellites with nanometer accuracy

AIP Conference Proceedings

Volumn 813, Issue , 2006, Pages 1213-1223

  Bae, Young K ^a  

^a Bae Institute   (United States)

Author keywords

Contamination free; Formation flying; Interferometer; Interferometric ranging; Intracavity; MAXIM; Micro; Nano; Photon thruster; Pico; Propellantless; Satellite; Spacecraft; SPECS; ST 3; Tether; TPF

Indexed keywords

EID: 33751220534     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2169304     Document Type: Conference Paper

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