Demonstration of nm-level active metrology for long range interferometric displacement measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4006, Issue , 2000, Pages

  Jeganathan, Muthu ^a   Dubovitsky, Serge ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASTRONOMY; DISTANCE MEASUREMENT; INTERFEROMETERS; LASER ACCESSORIES; LASER OPTICS; MIRRORS; SIGNAL TO NOISE RATIO; TRANSPONDERS;

LIGTWAVE LASER OFFSET LOCKING ACCESSORY (LOLA); NON-PLANAR RING OSCILLATOR (NPRO) LASERS;

INTERFEROMETRY;

EID: 0033684626     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)