The application of neutron reflectometry and atomic force microscopy in the study of corrosion inhibitor films

Physica B: Condensed Matter

Volumn 385-386, Issue , 2006, Pages 924-926

  John, Douglas ^a   Blom, Annabelle ^b   Bailey, Stuart ^a,b   Nelson, Andrew ^a,b   Schulz, Jamie ^a,b   De Marco, Roland ^a,b   Kinsella, Brian ^a,b  

^a CURTIN UNIVERSITY   (Australia)

^b UNIVERSITY OF SYDNEY   (Australia)

Author keywords

Atomic force microscopy; Corrosion inhibition; In situ neutron reflectometry; Interfacial structure; Micelles

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONCENTRATION (PROCESS); MICELLES; NEUTRONS; REFLECTOMETERS;

CORROSION INHIBITION; IN SITU NEUTRON REFLECTOMETRY; INHIBITION EFFICIENCY; INTERFACIAL STRUCTURE;

CORROSION INHIBITORS;

EID: 33751203573     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.05.213     Document Type: Article

References (8)

1. Ramachandran S., and Jovancicevic V. Corrosion 55 (1999) 259
2. Joseph M., and Klenerman D. J. Electroanaly. Chem. 340 (1992) 301
3. Heeg B., and Klenerman D. Langmuir 16 (2000) 1783
4. Atkin R., Craig V.S.J., Wanless E.J., and Biggs S. Adv. Colloid Interface Sci. 103 (2003) 219
5. Manne S., Schaffer T.E., Huo Q., Hansma P.K., Morse D.E., Stocky G.D., and Aksay I.A. Langmuir 13 (1997) 6382
6. Heeg B., Moros T., and Klenerman D. Corros. Sci. 40 (1998) 1303
7. Penfold J., Staples E., Tucker I., Tiddy G.J.T., and Khan Lodi A. J. Appl. Crystallogr. 30 (1997) 744
8. Free M.L. Corros. Sci. 44 (2002) 2865