Frequency dependence of microwave quality factor of doped ba xSr1-xTiO3 ferroelectric ceramics

Integrated Ferroelectrics

Volumn 61, Issue , 2004, Pages 177-181

  Karmanenko, S F ^a   Nenasheva, E A ^b   Dedyk, A I ^a   Kanareikyn, A D ^c   Semenov, A A ^a  

^a SAINT PETERSBURG ELECTROTECHNICAL UNIVERSITY LETI   (Russian Federation)

^b GIRICOND Research Institute   (Russian Federation)

^c EUCLID TECHLABS LLC   (United States)

Author keywords

Additives; Ferroelectric ceramics; Frequency dependence; Microwave quality factor

Indexed keywords

ADDITIVES; INTEGRATED CIRCUITS; MICROWAVES; THIN FILMS;

FREQUENCY DEPENDENCE; MICROWAVE QUALITY FACTOR; RADIOELECTRONIC SYSTEMS;

FERROELECTRIC CERAMICS;

EID: 33751166399     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580490459332     Document Type: Article

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