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Volumn 287, Issue 1-3, 2006, Pages 139-146

AFM study of paraffin wax surfaces

Author keywords

AFM morphology; Paraffin morphology; Paraffin surfaces; Paraffin wax

Indexed keywords

ATOMIC FORCE MICROSCOPY; MORPHOLOGY; PARAFFINS; SILICON WAFERS; SILICONES; SURFACE ROUGHNESS;

EID: 33751084587     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.colsurfa.2006.03.043     Document Type: Article
Times cited : (31)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.