Morphology of and dislocation movement in n-C40H82 paraffin crystals grown from solution

Journal of Crystal Growth

Volumn 249, Issue 3-4, 2003, Pages 600-613

  Plomp, M ^a,b   Van Enckevort, W J P ^a   Van Hoof, P J C M ^a,c   Van de Streek, C J ^a,d  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c NV ORGANON   (Netherlands)

^d Cambridge Crystallogr Data Centre   (United Kingdom)

Author keywords

A1. Atomic force microscopy; A1. Characterization; A1. Crystal morphology; A1. Line defects; A1. Surface structure; B1. Organic compounds

Indexed keywords

ADHESION; AGGREGATES; ATOMIC FORCE MICROSCOPY; DISLOCATIONS (CRYSTALS); EVAPORATION; NUCLEATION; OPTICAL MICROSCOPY; PARAFFINS; STRESSES;

LINE DEFECTS;

CRYSTAL GROWTH FROM MELT;

EID: 0037364746     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)02325-4     Document Type: Article

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