Impact of nanocrystal size on NVM array reliability performance

21st IEEE Non-Volatile Semiconductor Memory Workshop 2006, NVSMW 2006

Volumn 2006, Issue , 2006, Pages 64-65

  Gasquet, Horacio P ^a   Steimle, Robert F ^a   Rao, Rajesh A ^a   Muralidhar, Ramachandran ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33751054250     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/.2006.1629496     Document Type: Conference Paper

References (6)

1. R. Muralidhar, et al, IEDM Tech Digest, 2003.
2. M. Sadd, et al, Non-Volatile Semiconductor Memory Workshop, 2004.
3. R. A. Rao, et al, Solid State Device Materials Conf, 2003
4. M. Sadd, et al, Non-Volatile Semiconductor Memory Workshop, 2000.
5. R.A. Rao, et al, Proceedings of the 1st International Conference on Memory Technology and Design, Giens, France, 2005.
6. S. Tiwari, et al, Appl. Phys. Let., 68, 1377 (1996)