Thermoelectric properties for P-type (Bi2Te3) 0.2(Sb2Te3)0.8 alloys fabricated by shear extrusion

Metals and Materials International

Volumn 12, Issue 4, 2006, Pages 317-322

  Kim, Sang Seok ^a   Aizawa, Tatsuhiko ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b UNIVERSITY OF TORONTO   (Canada)

Author keywords

Anisotropy; Crystallographic orientation; Electron backscattered diffraction patterns (EBSP); P type; Shear extrusion

Indexed keywords

ANISOTROPY; BENDING STRENGTH; BISMUTH COMPOUNDS; DIFFRACTION PATTERNS; ELECTRON DIFFRACTION; INTERFEROMETRY; TEXTURES;

BULK MECHANICAL ALLOYING; CRYSTALLOGRAPHIC ORIENTATIONS; CRYSTALLOGRAPHIC STRUCTURE; ELECTRON BACKSCATTERED DIFFRACTION PATTERN; EXTRUSION PROCESS; P-TYPE; PREFERRED ORIENTATIONS; THERMOELECTRIC PROPERTIES;

EXTRUSION;

EID: 33751053218     PISSN: 15989623     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF03027548     Document Type: Article

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