Crystal chemistry of layered carbide, Ti3(Si0.43Ge0.57)C2

Journal of Physics and Chemistry of Solids

Volumn 67, Issue 12, 2006, Pages 2512-2516

  Yang, Hexiong ^a   Manoun, B ^a   Downs, R T ^b   Ganguly, A ^c   Barsoum, M W ^c  

^a FLORIDA INTERNATIONAL UNIVERSITY   (United States)

^b The University of Arizona   (United States)

^c Drexel University   (United States)

Author keywords

C. X ray diffraction; D. Crystal structure

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON TRANSPORT PROPERTIES; LAYERED MANUFACTURING; SINGLE CRYSTALS; TERNARY SYSTEMS; X RAY DIFFRACTION ANALYSIS;

CRYSTAL CHEMISTRY; DISPLACEMENT PARAMETERS; LAYERED CARBIDE;

TITANIUM COMPOUNDS;

EID: 33751024899     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2006.07.009     Document Type: Article

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