Mechanical properties of interference thin films on colored stainless steel evaluated by depth-sensing nanoindentation

Surface and Coatings Technology

Volumn 201, Issue 6, 2006, Pages 2431-2437

  Junqueira, Rosa M R ^a   Andrade, Margareth S ^a   Loureiro, Célia R O ^a   Buono, Vicente T L ^b  

^a FUNDAÇÃO CENTRO TECNOLÓGICO DE MINAS GERAIS   (Brazil)

^b FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

Author keywords

Colored stainless steel; Interference films; Mechanical properties; Nanoindentation; Porosity

Indexed keywords

ATOMIC FORCE MICROSCOPY; HARDNESS; INDENTATION; POROSITY; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; SURFACE ROUGHNESS; THIN FILM TRANSISTORS; WEAR RESISTANCE;

BERKOVICH INDENTER; COLORED STAINLESS STEEL; DRY WEAR RESISTANCE; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; INTERFERENCE THIN FILMS; NANOINDENTATION; NANOSCRATCHING;

ELECTRODEPOSITION;

ATOMIC FORCE MICROSCOPY; ELECTRODEPOSITION; HARDNESS; INDENTATION; POROSITY; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; SURFACE ROUGHNESS; THIN FILM TRANSISTORS; WEAR RESISTANCE;

EID: 33751002341     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2006.04.023     Document Type: Article

References (18)

1. Evans T.E. Corros. Sci. 17 (1977) 105
2. R.M.R, Junqueira,. PhD Thesis, Universidade Federal de Minas Gerais, Brazil, 2004 (in Portuguese).
3. Pharr G.M. Mater. Sci. Eng., A 253 (1998) 151
4. Oliver W.C., and Pharr G.M. J. Mater. Res. 7 (1992) 1564
5. Saha R., and Nix W.D. Acta Mater. 50 (2002) 23
6. Chicot D., and Lesage J. Thin Solid Films 254 (1995) 123
7. Jönsson B., and Hogmark S. Thin Solid Films 114 (1984) 257
8. Burnett P.J., and Rickerby D.S. Thin Solid Films 148 (1987) 41
9. Korsunsky A.M., McGurk M.R., Bull S.J., and Page T.F. Surf. Coat. Technol. 99 (1998) 171
10. Puchi-Cabrera E.S. Surf. Coat. Technol. 160 (2002) 177
11. Page T.F., and Hainsworth S.V. Surf. Coat. Technol. 61 (1993) 201
12. Kazmanli M.K., Rother B., Urgen M., and Mitterer C. Surf. Coat. Technol. 107 (1998) 65
13. Xiaodong L., and Bharat B. Thin Solid Films 315 (1998) 214
14. Junqueira R.M.R., and Oliveira C.R. Acta Microsc. 5 Supplement B (1996) 358
15. J.C. Russ, Computer-Assisted Microscopy-The Measurement and Analysis of Images. In: Cap.7 Image Measurements, 3a. ed. Plenum Press, New York, 1992, p.175.
16. Montgomery D.C. Arizona State Univ. Design and Analysis of Experiments. 5th edn. (1991) 684 pp.
17. Duncan D.B. Biometrics 11 (1955) 1
18. Kaiyang Z., Furong Z., Jianqiao H., Lu S., Keran Z., and Hao G. Thin Solid Films 443 (2003) 60