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Volumn , Issue , 2003, Pages 683-688
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Statistical inversion approach for optimizing current patterns in eit
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Author keywords
[No Author keywords available]
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Indexed keywords
COVARIANCE MATRIX;
ELECTRIC IMPEDANCE TOMOGRAPHY;
OPTIMAL SYSTEMS;
RICCATI EQUATIONS;
TOMOGRAPHY;
CONDUCTIVITY DISTRIBUTIONS;
DISTINGUISHABILITY;
ELECTRICAL IMPEDANCE TOMOGRAPHY;
OPTIMAL CURRENT PATTERNS;
OPTIMAL STATE ESTIMATION;
POSTERIOR COVARIANCE MATRIXES;
PRIOR INFORMATION;
STATISTICAL INVERSION;
PROBABILITY DISTRIBUTIONS;
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EID: 33750956797
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (8)
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