Noise and sampling analysis for multiple-image radiography

2006 3rd IEEE International Symposium on Biomedical Imaging: From Nano to Macro - Proceedings

Volumn 2006, Issue , 2006, Pages 1232-1235

  Marquet, Bruno ^a   Brankov, Jovan G ^a   Wernick, Miles N ^a  

^a Illinois Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING SYSTEMS; SPURIOUS SIGNAL NOISE; X RAY ANALYSIS; X RAY SCATTERING;

MULTIPLE IMAGE RADIOGRAPHY (MIR); NOISE PROPERTIES; X-RAY ABSORPTION; X-RAY IMAGING METHOD;

X RAY RADIOGRAPHY;

EID: 33750944750     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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