Acoustic attenuation measurements in transparent materials in the hypersonic range by picosecond ultrasonics

Applied Physics Letters

Volumn 89, Issue 19, 2006, Pages

  Emery, P ^a   Devos, A ^b  

^a STMICROELECTRONICS   (France)

^b INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTRONICS; SILICA; THIN FILMS; TRANSPARENCY; ULTRAFAST PHENOMENA;

ACOUSTIC ATTENUATION MEASUREMENTS; HYPERSONICS; TRANSPARENT THIN FILMS; ULTRAFAST TECHNIQUE;

ATTENUATION;

EID: 33750914122     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2372745     Document Type: Article

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