A different way of performing picosecond ultrasonic measurements in thin transparent films based on laser-wavelength effects

Applied Physics Letters

Volumn 86, Issue 21, 2005, Pages 1-3

  Devos, A ^a   Cote R ^a   Caruyer, G ^b   Lefvre A ^c  

^a INSTITUT D ELECTRONIQUE   (France)

^b STMICROELECTRONICS   (France)

^c CEA LETI   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTICS; DIELECTRIC MATERIALS; ELASTIC MODULI; METALLIC FILMS; OSCILLATIONS; PHONONS; SILICON; THIN FILMS;

LASER-WAVELENGTH EFFECTS; PICOSECOND ULTRASONIC MEASUREMENTS; THIN DIELECTRIC LAYERS; THIN TRANSPARENT FILMS;

ULTRASONICS;

EID: 20844439688     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1929869     Document Type: Article

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