Fast tracking of ellipses using edge-projected integration of cues

Proceedings - International Conference on Pattern Recognition

Volumn 15, Issue 4, 2000, Pages 72-75

  Vincze, Markus ^a   Ayromlou, Minu ^a   Zillich, Michael ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION SYSTEMS;

COMMERCIAL APPLICATIONS; CONTOUR EDGES; EDGE PROJECTED INTEGRATION OF CUES; FAST-TRACKING; FIELD RATES; INTENSITY VALUES; MOST LIKELY; REAL TIME CAPABILITY;

GEOMETRY;

EID: 33750910178     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (14)

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