Ellipse detection based on symmetry

Pattern Recognition Letters

Volumn 20, Issue 1, 1999, Pages 41-47

  Lei, Yiwu ^a   Wong, Kok Cheong ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Ellipse detection; Feature extraction; Image processing; Symmetry detection

Indexed keywords

ALGORITHMS; HOUGH TRANSFORMS; IMAGE PROCESSING;

ELLIPSE DETECTION; SYMMETRY DETECTION;

FEATURE EXTRACTION;

EID: 0032761471     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(98)00127-5     Document Type: Article

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