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Volumn 89, Issue 19, 2006, Pages
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Erratum: Application of the interface capacitance model to thin film relaxors and ferroelectrics (Applied Physics Letters (2006) 89 (196101))
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33750897065
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2385632 Document Type: Erratum |
Times cited : (4)
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References (7)
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