Spectral imaging and multivariate statistical analysis from thin specimens in the SEM with a four-channel silicon drift detector

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1390-1391

  Kotula, P G ^a   Michael, J R ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750881929     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606066955     Document Type: Conference Paper

References (4)

1. T. Schülein, R. Terborg, M. Rohde, Microsc Microanal 11(Suppl 2) (2005) 460.
2. P.G. Kotula, M.R. Keenan, and J.R. Michael, Microsc. Microanal. 9 (2003) 1-17.
3. P.G. Kotula and M.R. Keenan, Microsc. Microanal. 9 (Suppl 2) (2003) 152.
4. The authors would like to acknowledge the assistance of Bonnie McKenzie with the acquisition of spectral images, Gary Bryant for fabrication of the graphite specimen holders, David Melgaard for the provision of the data translation software and Martin Rohde of Roentec Gmbh for providing the spectral image file format. Sandia is a multiprogram laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States National Nuclear Security Administration, which is part of the Department of Energy (DOE), under contract DE-AC04 94AL85000.